ANALYSIS OF THERMAL-BEHAVIOR OF HIGH-POWER SEMICONDUCTOR-LASER ARRAYS BY MEANS OF THE FINITE-ELEMENT METHOD (FEM)

被引:22
作者
BARWOLFF, A
PUCHERT, R
ENDERS, P
MENZEL, U
ACKERMANN, D
机构
[1] Max-Born-Institut für Nichtlineare Optik und Kurzzeitspektroskopie, Berlin, D-12489
来源
JOURNAL OF THERMAL ANALYSIS | 1995年 / 45卷 / 03期
关键词
FINITE ELEMENT METHOD (FEM); SEMICONDUCTOR;
D O I
10.1007/BF02548775
中图分类号
O414.1 [热力学];
学科分类号
摘要
New results of steady-state two-dimensional finite-element computations of temperature distributions of high power semiconductor laser arrays are presented. The influence of different thermal loads on the 2D temperature distribution in AlGaAs/GaAs gain-guided laser arrays is investigated. The FEM model is tested by comparing it with analytical solutions. For numerical convenience, the latter is rewritten in a novel form, which is free of overflow problems. The maximum temperatures calculated by both methods agree within 1%. Several factors determining the thermal resistance of the device are quantitatively examined: the ratio of light emitting to non-emitting areas along the active zone, the amount of Joule losses, the current spreading, the solder thickness, and voids in the solder. This yields design rules for optimum thermal performance.
引用
收藏
页码:417 / 436
页数:20
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