INSITU X-RAY-DIFFRACTION MEASUREMENT OF THIN-FILM TRANSFORMATION KINETICS USING A LINEAR POSITION-SENSITIVE DETECTOR

被引：0
|
作者：
CHEN, H [1 ]
LITTLE, TW [1 ]
机构：
[1] UNIV ILLINOIS,DEPT MAT SCI & ENGN,URBANA,IL 61801
来源：
JOURNAL OF METALS | 1987年 / 39卷 / 10期
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D O I：
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中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
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页码：A25 / A25
页数：1
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