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- [1] INSITU X-RAY-DIFFRACTION MEASUREMENT OF PD2SI TRANSFORMATION KINETICS USING A LINEAR POSITION-SENSITIVE DETECTORJOURNAL OF APPLIED PHYSICS, 1988, 63 (04) : 1182 - 1190LITTLE, TWCHEN, H
- [2] X-RAY-DIFFRACTION TEXTURE ANALYSIS WITH A POSITION-SENSITIVE DETECTORZEITSCHRIFT FUR METALLKUNDE, 1993, 84 (07): : 479 - 493WCISLAK, LBUNGE, HJNAUERGERHARDT, CU
- [3] MEASUREMENT OF GRAZING-INCIDENCE X-RAY-DIFFRACTION SCATTERING WITH A POSITION-SENSITIVE DETECTORFIZIKA TVERDOGO TELA, 1988, 30 (10): : 2881 - 2884LOMOV, AANOVIKOV, DVGOGANOV, DAGUTKEVICH, SM
- [4] INSITU EXAMINATION OF THIN-FILM GROWTH-KINETICS AND STRESS DEVELOPMENT USING X-RAY-DIFFRACTIONJOURNAL OF METALS, 1987, 39 (07): : A64 - A64WHITE, GELITTLE, TWCHEN, H
- [5] X-RAY-DIFFRACTION STUDY OF THE STRUCTURE CHANGES IN IRRADIATED POLYETHYLENE, USING A POSITION-SENSITIVE DETECTORDOKLADY AKADEMII NAUK SSSR, 1986, 287 (06): : 1434 - 1436RAZUMOVA, LLBYSTRITSKAIA, EVMOGILEVSKII, LITSAKULIN, NPZAIKOV, GEBYKOV, EVKARPUKHIN, ON
- [6] SYSTEM FOR KINETIC X-RAY-DIFFRACTION USING A POSITION-SENSITIVE COUNTERNUCLEAR INSTRUMENTS & METHODS, 1978, 152 (01): : 199 - 203HASHIZUME, HMASE, KAMEMIYA, YKOHRA, K
- [7] DYNAMIC X-RAY-DIFFRACTION MEASUREMENTS WITH A POSITION-SENSITIVE COUNTERACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 : S235 - S235FARUQI, ARLEIGH, JS
- [8] TESTS OF A LINEAR POSITION-SENSITIVE PROPORTIONAL COUNTER ON AN X-RAY-DIFFRACTION GONIOMETER WITH COUNTERBULLETIN DE LA SOCIETE FRANCAISE DE CERAMIQUE, 1976, (111): : 89 - 92BERNHARD, JDLOISEL, M
- [9] ABSORPTION CORRECTIONS AND DIGITAL FILTERING OF X-RAY-DIFFRACTION PROFILES RECORDED WITH A POSITION-SENSITIVE DETECTORJOURNAL OF APPLIED CRYSTALLOGRAPHY, 1985, 18 (DEC) : 487 - 492BURIAN, ALECANTE, PMOSSET, AGALY, JVANDUN, JMORTIER, WJ