X-RAY-DIFFRACTION TOPOGRAPHIC STUDY OF BASAL DISLOCATIONS IN SAPPHIRE CRYSTAL

被引：1

作者：

ZHANG, Q

DENG, P

机构：

来源：

MATERIALS LETTERS | 1989年 / 8卷 / 3-4期

关键词：

D O I：

10.1016/0167-577X(89)90137-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：105 / 108

页数：4

共 11 条

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