SCANNING POSITRON MICROBEAM

被引：42

作者：

BRANDES, GR ^{[1
]}

CANTER, KF ^{[1
]}

HORSKY, TN ^{[1
]}

LIPPEL, PH ^{[1
]}

MILLS, AP ^{[1
]}

机构：

[1] AT&T BELL LABS,MURRAY HILL,NJ 07974

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1988年 / 59卷 / 02期

关键词：

D O I：

10.1063/1.1140231

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：228 / 232

页数：5

共 30 条

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[9] MEASUREMENT OF POSITRON REEMISSION FROM THIN SINGLE-CRYSTAL W(100) FILMS [J].

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