COMPARISON BETWEEN POSITIVE MUON RESEARCH AND POSITRON-ANNIHILATION IN THE STUDY OF CRYSTALLINE DEFECTS

被引：1

作者：

DOYAMA, M ^{[1
]}

机构：

[1] UNIV BRITISH COLUMBIA,TRIUMF,VANCOUVER V6T 2A3,BC,CANADA

来源：

HYPERFINE INTERACTIONS | 1981年 / 8卷 / 4-6期

关键词：

D O I：

10.1007/BF01037548

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

引用

页码：701 / 709

页数：9

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