COMPARISON BETWEEN POSITIVE MUON RESEARCH AND POSITRON-ANNIHILATION IN THE STUDY OF CRYSTALLINE DEFECTS

被引：1
|
作者：
DOYAMA, M [1 ]
机构：
[1] UNIV BRITISH COLUMBIA,TRIUMF,VANCOUVER V6T 2A3,BC,CANADA
来源：
HYPERFINE INTERACTIONS | 1981年 / 8卷 / 4-6期
关键词：
D O I：
10.1007/BF01037548
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
引用
收藏
页码：701 / 709
页数：9
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