CRYSTAL-GLASS TRANSITION OF ZR/CO MULTILAYERS EXAMINED BY CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY AND ELECTRICAL CONDUCTANCE MEASUREMENTS

被引:11
|
作者
SCHRODER, H [1 ]
SAMWER, K [1 ]
机构
[1] SONDERFORSCH BEREICH 126,D-3400 GOTTINGEN,FED REP GER
关键词
D O I
10.1524/zpch.1988.157.Part_1.265
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:265 / 270
页数:6
相关论文
共 50 条
  • [21] A NOVEL TECHNIQUE FOR THE PREPARATION OF THIN-FILMS FOR CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
    HEUER, JP
    HOWITT, DG
    JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1990, 14 (01): : 79 - 82
  • [22] PREPARATION OF CROSS-SECTIONAL SPECIMENS OF CERAMIC THERMAL BARRIER COATINGS FOR TRANSMISSION ELECTRON-MICROSCOPY
    UNAL, O
    HEUER, AH
    MITCHELL, TE
    JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1990, 14 (04): : 307 - 312
  • [23] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY INVESTIGATION OF XENON IRRADIATED GLASSY-CARBON
    MCCULLOCH, D
    PRAWER, S
    HOFFMAN, A
    SOOD, DK
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 80-1 : 1480 - 1484
  • [24] SURFACE-DEFECTS IN POLISHED SILICON STUDIED BY CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
    JOHANSSON, S
    SCHWEITZ, JA
    LAGERLOF, KPD
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1989, 72 (07) : 1136 - 1139
  • [26] COMPARISON OF DAMAGE PROFILES OBTAINED BY ANGLE LAPPING STAINING AND CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY
    CARTER, CH
    MASZARA, W
    ROZGONYI, GA
    SADANA, DK
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 463 : 106 - 112
  • [27] TRANSMISSION ELECTRON-MICROSCOPY CROSS-SECTIONAL OBSERVATION ON MECHANICALLY AND CHEMICALLY LAPPED SI (111) SURFACES
    WU, XJ
    HORIUCHI, S
    SHIWAKU, H
    HYODO, K
    ANDO, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1992, 31 (6B): : L803 - L806
  • [28] SAMPLE PREPARATION TECHNIQUE FOR CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF QUANTUM-WIRE STRUCTURES
    CHEN, YP
    REED, JD
    OKEEFE, SS
    SCHAFF, WJ
    EASTMAN, LF
    MICROSCOPY RESEARCH AND TECHNIQUE, 1993, 26 (02) : 157 - 161
  • [29] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF THIN-FILM POLYCRYSTALLINE SEMICONDUCTORS BY CONVENTIONAL MICROTOMY
    ALBUYARON, A
    FRANK, A
    NOUFI, R
    THIN SOLID FILMS, 1993, 227 (01) : 18 - 23
  • [30] CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPY OF PRECISELY SELECTED REGIONS FROM SEMICONDUCTOR-DEVICES
    KIRK, ECG
    WILLIAMS, DA
    AHMED, H
    MICROSCOPY OF SEMICONDUCTING MATERIALS 1989, 1989, 100 : 501 - 506