INVESTIGATION OF THE CRITICAL STATE OF SPUTTERED YBA2CU3O7-X THIN-FILMS USING A HALL PROBE

被引:8
作者
RAUCH, W [1 ]
BEHNER, H [1 ]
GORNIK, E [1 ]
机构
[1] SIEMENS AG,CORP RES & DEV,W-8520 ERLANGEN,GERMANY
来源
PHYSICA C | 1992年 / 201卷 / 1-2期
关键词
D O I
10.1016/0921-4534(92)90124-U
中图分类号
O59 [应用物理学];
学科分类号
摘要
The critical state of DC-magnetron sputtered YBa2Cu3O7-x (YBCO) thin films with critical temperatures of 90 K and critical current densities well beyond 10(6) A/cm2 was investigated after magnetization with a magnetic field of 0.14 T. The sample surface of the square-shaped YBCO films was scanned using a Hall probe and the remanent axial magnetic field in the critical state was measured at a distance of z=0.5 mm above the sample. A comparison with theoretical calculations of the axial magnetic field resulted in a good qualitative agreement of experiment and calculation. This indicates that the samples were homogeneous. Additionally, a mapping of the critical state yields a more reliable j(c)-value compared to a single local measurement without any information about the homogeneity of the sample.
引用
收藏
页码:197 / 201
页数:5
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