共 47 条
- [4] X-ray diffraction analysis of epigrowth on porous 4H-SiC substrates SILICON CARBIDE AND RELATED MATERIALS 2004, 2005, 483 : 265 - 268
- [7] CVD growth of graphene stacks on 4H-SiC (0001) surface - X-ray diffraction and raman spectroscopy study 1600, Polska Akademia Nauk (124):
- [8] Residual stress measurements of 4H-SiC crystals using x-ray diffraction SILICON CARBIDE AND RELATED MATERIALS 2013, PTS 1 AND 2, 2014, 778-780 : 453 - +