POINT-SOURCE PHYSICS - APPLICATION TO ELECTRON PROJECTION MICROSCOPY AND HOLOGRAPHY

被引：8

作者：

MORIN, R

机构：

来源：

MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1994年 / 5卷 / 4-6期

关键词：

D O I：

10.1051/mmm:0199400504-6050100

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Ultra-sharp field emitters are able to produce low energy electron beams. This paper presents recent experiments demonstrating the strong coupling between the atomic properties of the source and the properties of the associated electron beam. These experiments include atomic scale work on the source as well as a characterization of the emitted electron wave through projection holography and interferometry experiments.

引用

页码：501 / 508

页数：8

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