ENERGY-DISPERSIVE X-RAY-DIFFRACTION (EDXD) APPARATUS FOR LIQUIDS AT HIGH-TEMPERATURE

被引：0

作者：

SUGIYAMA, K

PETKOV, VG

TAKEDA, S

WASEDA, Y

机构：

来源：

SCIENCE REPORTS OF THE RESEARCH INSTITUTES TOHOKU UNIVERSITY SERIES A-PHYSICS CHEMISTRY AND METALLURGY | 1993年 / 38卷 / 01期

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中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A high temperature energy dispersive X-ray diffraction (EDXD) apparatus has been built using a vertical type goniometer, which makes it possible to measure the diffraction profiles of liquids up to 1873 K. The fundamentals of this apparatus were tested by obtaining the interference function of a SiO2 glass over Q=200 nm-1 at room temperature. The feasibility of this EDXD apparatus for high temperature liquids was confirmed by structural study of liquid bismuth germanate (Bi4Ge3O12) at 1373 K.

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页码：1 / 13

页数：13