AN X-RAY METHOD FOR MEASURING THE THICKNESS OF THIN CRYSTALLINE FILMS

被引：12

作者：

EISENSTEIN, A

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1946年 / 17卷 / 11期

关键词：

D O I：

10.1063/1.1707656

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：874 / 878

页数：5

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