PARTICLE-INITIATED BREAKDOWN IN SF6 INSULATED SYSTEMS UNDER HIGH DIRECT VOLTAGE

被引:33
|
作者
RIZK, FAM
MASETTI, C
COMSA, RP
机构
[1] PIRELLI IND,MILAN,ITALY
[2] MCGILL UNIV,MONTREAL H3C 3G1,QUEBEC,CANADA
来源
关键词
D O I
10.1109/TPAS.1979.319295
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:825 / 836
页数:12
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