XPS STUDY OF REDUCTION EFFECTS IN NB-DOPED PZT CERAMICS

被引:8
作者
RAJOPADHYE, NR [1 ]
BHORASKAR, SV [1 ]
BADRINARAYAN, S [1 ]
机构
[1] NATL CHEM LAB,POONA 411008,MAHARASHTRA,INDIA
关键词
D O I
10.1002/sia.740100804
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:392 / 395
页数:4
相关论文
共 15 条
[1]   PARALLEL-PLATE ELECTRON MULTIPLIER [J].
ANDERSSON, LP ;
GRUSELL, E ;
BERG, S .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (11) :1015-1022
[2]   PIEZOELECTRIC PROPERTIES OF POLYCRYSTALLINE LEAD TITANATE ZIRCONATE COMPOSITIONS [J].
BERLINCOURT, DA ;
CMOLIK, C ;
JAFFE, H .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1960, 48 (02) :220-229
[3]   ELECTRICAL-CONDUCTIVITY IN LEAD ZIRCONATE-TITANATE CERAMICS [J].
DIH, JJ ;
FULRATH, RM .
JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1978, 61 (9-10) :448-451
[4]  
DIMZA V, 1982, PHYS STATU SOL A, V72, pK57
[5]   SECONDARY-ELECTRON EMISSION OF DOPED PZT CERAMICS [J].
DIXIT, AV ;
RAJOPADHYE, NR ;
BHORASKAR, SV .
JOURNAL OF MATERIALS SCIENCE, 1986, 21 (08) :2798-2802
[6]   PROPERTIES OF PIEZOELECTRIC CERAMICS IN THE SOLID-SOLUTION SERIES LEAD TITANATE-LEAD ZIRCONATE-LEAD OXIDE - TIN OXIDE AND LEAD TITANATE-LEAD HAFNATE [J].
JAFFE, B ;
ROTH, RS ;
MARZULLO, S .
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS, 1955, 55 (05) :239-254
[7]   X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF NICKEL-OXYGEN SURFACES USING OXYGEN AND ARGON ION-BOMBARDMENT [J].
KIM, KS ;
WINOGRAD, N .
SURFACE SCIENCE, 1974, 43 (02) :625-643
[8]   X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES OF PBO SURFACES BOMBARDED WITH HE+, NE+, AR+, XE+ AND KR+ [J].
KIM, KS ;
BAITINGER, WE ;
WINOGRAD, N .
SURFACE SCIENCE, 1976, 55 (01) :285-290
[9]   MINIATURISED ELECTRON-GUN FOR MEASUREMENTS OF WORK FUNCTION VARIATIONS BY THE METHOD OF RETARDING POTENTIAL IN AN AXIAL MAGNETIC-FIELD [J].
KLAUSER, SJ ;
BAS, EB .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1979, 12 (09) :841-844
[10]   X-RAY PHOTOELECTRON-SPECTROSCOPY (XPS) STUDIES OF HYDROGEN REDUCED RUTILE (TIO2-X) SURFACES [J].
LAZARUS, MS ;
SHAM, TK .
CHEMICAL PHYSICS LETTERS, 1982, 92 (06) :670-673