CORRECTION OF THE SELF-ABSORPTION EFFECT IN FLUORESCENCE X-RAY-ABSORPTION FINE-STRUCTURE

被引：32

作者：

IIDA, A ^{[1
]}

NOMA, T ^{[1
]}

机构：

[1] CANON INC,CANON RES CTR,ATSUGI,KANAGAWA 24301,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 6A期

关键词：

XAFS; XANES; SELF-ABSORPTION EFFECT; FLUORESCENCE XAFS;

D O I：

10.1143/JJAP.32.2899

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The X-ray absorption fine structure (XAFS) measured with the X-ray fluorescence yield strongly depends on the concentration, thickness and detection geometry resulting from the self-absorption eff ect. A correction procedure for the self-absorption effect is presented using a simple theory of X-ray fluorescence yield and applied to X-ray absorption near-edge structure (XANES) of a thin iron foil and an iron compound. The accuracy of the self-absorption correction is discussed.

引用

收藏

页码：2899 / 2902

页数：4

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