共 50 条
- [41] Electro-Migration Model Parameters Sensitivity Analysis Based on the Monte Carlo Method [J]. 2013 PROGNOSTICS AND HEALTH MANAGEMENT CONFERENCE (PHM), 2013, 33 : 1093 - 1098
- [43] Block-Level Electro-Migration Analysis (BEMA) for Safer Product Life [J]. 2015 28TH INTERNATIONAL CONFERENCE ON VLSI DESIGN (VLSID), 2015, : 276 - 281
- [44] Analysis of Diffusion Induced Deformation Considering Electro-Migration in Lithium-ion Batteries [J]. INTERNATIONAL JOURNAL OF ELECTROCHEMICAL SCIENCE, 2020, 15 (07): : 6012 - 6023
- [45] Effect of aluminum trace dimension on electro-migration failure in flip-chip package [J]. INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2017, 31 (07):
- [46] The open-pin failure of power device under the combined effect of thermo-migration and electro-migration [J]. CHINESE SCIENCE BULLETIN-CHINESE, 2020, 65 (20): : 2169 - 2177
- [48] Assessment of diffusion coefficient of chloride ion in mortar made of several binder by electro-migration method [J]. Zairyo, 8 (876-881):
- [49] Electron irradiation-induced electro-migration and diffusion of defects in Mg-doped GaN [J]. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 2003, 239 (02): : 310 - 315
- [50] Electro-migration parameter-a dynamic current ramp measurement method of current density exponent [J]. Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1997, 18 (11): : 825 - 831