X-RAY ANOMALOUS SCATTERING FACTORS FOR SILICON AND GERMANIUM

被引：39
|
作者：
GERWARD, L
THUESEN, G
JENSEN, MS
ALSTRUP, I
机构：
[1] TECH UNIV DENMARK,DIA B,DK-2800 LYNGBY,DENMARK
[2] HALDOR TOPSOE RES LABS,DK-2800 LYNGBY,DENMARK
来源：
ACTA CRYSTALLOGRAPHICA SECTION A | 1979年 / 35卷 / SEP期
关键词：
D O I：
10.1107/S0567739479001935
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
引用
收藏
页码：852 / 857
页数：6
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