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SQUID GALVANOMETER FOR MEASUREMENTS OF THE QUANTIZED HALL RESISTANCE
被引:2
作者
:
MURAYAMA, Y
论文数:
0
引用数:
0
h-index:
0
MURAYAMA, Y
ENDO, T
论文数:
0
引用数:
0
h-index:
0
ENDO, T
KOYANAGI, M
论文数:
0
引用数:
0
h-index:
0
KOYANAGI, M
机构
:
来源
:
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
|
1987年
/ 26卷
/ 07期
关键词
:
D O I
:
10.1143/JJAP.26.1159
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:1159 / 1163
页数:5
相关论文
共 21 条
[1]
SQUID DEVICE FOR AC CURRENT MEASUREMENTS DOWN TO 10-14-A
BARBANERA, S
论文数:
0
引用数:
0
h-index:
0
BARBANERA, S
CARELLI, P
论文数:
0
引用数:
0
h-index:
0
CARELLI, P
MODENA, I
论文数:
0
引用数:
0
h-index:
0
MODENA, I
ROMANI, GL
论文数:
0
引用数:
0
h-index:
0
ROMANI, GL
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(02)
: 905
-
909
[2]
BARONE A, 1982, PHYSICS APPLICATIONS, P426
[3]
HIGH-PRECISION MEASUREMENTS OF THE QUANTIZED HALL RESISTANCE AT THE PTB
BLIEK, L
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
BLIEK, L
BRAUN, E
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
BRAUN, E
MELCHERT, F
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
MELCHERT, F
WARNECKE, P
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
WARNECKE, P
SCHLAPP, W
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
SCHLAPP, W
WEIMANN, G
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
WEIMANN, G
PLOOG, K
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
PLOOG, K
EBERT, G
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
EBERT, G
DORDA, GE
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
DORDA, GE
[J].
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1985,
34
(02)
: 304
-
305
[4]
A TEST OF THE QUANTUM HALL-EFFECT AS A RESISTANCE STANDARD
CAGE, ME
论文数:
0
引用数:
0
h-index:
0
CAGE, ME
DZIUBA, RF
论文数:
0
引用数:
0
h-index:
0
DZIUBA, RF
FIELD, BF
论文数:
0
引用数:
0
h-index:
0
FIELD, BF
[J].
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1985,
34
(02)
: 301
-
303
[5]
IMPEDANCE MATCHING A JOSEPHSON GALVANOMETER BY MEANS OF A SUPERCONDUCTING TRANSFORMER
CLARKE, J
论文数:
0
引用数:
0
h-index:
0
CLARKE, J
TENNANT, WE
论文数:
0
引用数:
0
h-index:
0
TENNANT, WE
WOODY, D
论文数:
0
引用数:
0
h-index:
0
WOODY, D
[J].
JOURNAL OF APPLIED PHYSICS,
1971,
42
(10)
: 3859
-
&
[6]
MEASUREMENT SYSTEM FOR QUANTUM HALL-EFFECT UTILIZING A JOSEPHSON POTENTIOMETER
ENDO, T
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ENDO, T
MURAYAMA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
MURAYAMA, Y
KOYANAGI, M
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
KOYANAGI, M
KINOSHITA, J
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
KINOSHITA, J
INAGAKI, K
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
INAGAKI, K
YAMANOUCHI, C
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
YAMANOUCHI, C
YOSHIHIRO, K
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
YOSHIHIRO, K
[J].
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1985,
34
(02)
: 323
-
327
[7]
HIGH-ACCURACY JOSEPHSON POTENTIOMETER
ENDO, T
论文数:
0
引用数:
0
h-index:
0
机构:
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
ENDO, T
KOYANAGI, M
论文数:
0
引用数:
0
h-index:
0
机构:
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
KOYANAGI, M
NAKAMURA, A
论文数:
0
引用数:
0
h-index:
0
机构:
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
NAKAMURA, A
[J].
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1983,
32
(01)
: 267
-
271
[8]
A MEASUREMENT SYSTEM FOR THE DETERMINATION OF H/E2 IN TERMS OF THE SL OHM AND THE MAINTAINED OHM AT THE NPL
HARTLAND, A
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
HARTLAND, A
DAVIES, GJ
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
DAVIES, GJ
WOOD, DR
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
WOOD, DR
[J].
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1985,
34
(02)
: 309
-
314
[9]
KINOSHITA J, 1983, P INT S F QUANTUM ME, P339
[10]
KINOSHITA J, IN PRESS P CPEM86
←
1
2
3
→
共 21 条
[1]
SQUID DEVICE FOR AC CURRENT MEASUREMENTS DOWN TO 10-14-A
BARBANERA, S
论文数:
0
引用数:
0
h-index:
0
BARBANERA, S
CARELLI, P
论文数:
0
引用数:
0
h-index:
0
CARELLI, P
MODENA, I
论文数:
0
引用数:
0
h-index:
0
MODENA, I
ROMANI, GL
论文数:
0
引用数:
0
h-index:
0
ROMANI, GL
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(02)
: 905
-
909
[2]
BARONE A, 1982, PHYSICS APPLICATIONS, P426
[3]
HIGH-PRECISION MEASUREMENTS OF THE QUANTIZED HALL RESISTANCE AT THE PTB
BLIEK, L
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
BLIEK, L
BRAUN, E
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
BRAUN, E
MELCHERT, F
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
MELCHERT, F
WARNECKE, P
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
WARNECKE, P
SCHLAPP, W
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
SCHLAPP, W
WEIMANN, G
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
WEIMANN, G
PLOOG, K
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
PLOOG, K
EBERT, G
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
EBERT, G
DORDA, GE
论文数:
0
引用数:
0
h-index:
0
机构:
FERMELDE TECH ZENT,DARMSTADT,FED REP GER
DORDA, GE
[J].
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1985,
34
(02)
: 304
-
305
[4]
A TEST OF THE QUANTUM HALL-EFFECT AS A RESISTANCE STANDARD
CAGE, ME
论文数:
0
引用数:
0
h-index:
0
CAGE, ME
DZIUBA, RF
论文数:
0
引用数:
0
h-index:
0
DZIUBA, RF
FIELD, BF
论文数:
0
引用数:
0
h-index:
0
FIELD, BF
[J].
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1985,
34
(02)
: 301
-
303
[5]
IMPEDANCE MATCHING A JOSEPHSON GALVANOMETER BY MEANS OF A SUPERCONDUCTING TRANSFORMER
CLARKE, J
论文数:
0
引用数:
0
h-index:
0
CLARKE, J
TENNANT, WE
论文数:
0
引用数:
0
h-index:
0
TENNANT, WE
WOODY, D
论文数:
0
引用数:
0
h-index:
0
WOODY, D
[J].
JOURNAL OF APPLIED PHYSICS,
1971,
42
(10)
: 3859
-
&
[6]
MEASUREMENT SYSTEM FOR QUANTUM HALL-EFFECT UTILIZING A JOSEPHSON POTENTIOMETER
ENDO, T
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ENDO, T
MURAYAMA, Y
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
MURAYAMA, Y
KOYANAGI, M
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
KOYANAGI, M
KINOSHITA, J
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
KINOSHITA, J
INAGAKI, K
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
INAGAKI, K
YAMANOUCHI, C
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
YAMANOUCHI, C
YOSHIHIRO, K
论文数:
0
引用数:
0
h-index:
0
机构:
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
ELECTROTECH LAB,DEVICE FUNDAMENTALS SECT,SAKURA,IBARAKI 305,JAPAN
YOSHIHIRO, K
[J].
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1985,
34
(02)
: 323
-
327
[7]
HIGH-ACCURACY JOSEPHSON POTENTIOMETER
ENDO, T
论文数:
0
引用数:
0
h-index:
0
机构:
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
ENDO, T
KOYANAGI, M
论文数:
0
引用数:
0
h-index:
0
机构:
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
KOYANAGI, M
NAKAMURA, A
论文数:
0
引用数:
0
h-index:
0
机构:
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
SUMITOMO MET MIN CO LTD,TOKYO,JAPAN
NAKAMURA, A
[J].
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1983,
32
(01)
: 267
-
271
[8]
A MEASUREMENT SYSTEM FOR THE DETERMINATION OF H/E2 IN TERMS OF THE SL OHM AND THE MAINTAINED OHM AT THE NPL
HARTLAND, A
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
HARTLAND, A
DAVIES, GJ
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
DAVIES, GJ
WOOD, DR
论文数:
0
引用数:
0
h-index:
0
机构:
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
BRITISH TELECOM RES LABS,IPSWICH IP5 7RE,SUFFOLK,ENGLAND
WOOD, DR
[J].
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT,
1985,
34
(02)
: 309
-
314
[9]
KINOSHITA J, 1983, P INT S F QUANTUM ME, P339
[10]
KINOSHITA J, IN PRESS P CPEM86
←
1
2
3
→