Physical and Electrochemical Properties of Li-Intercalated Sn Oxide Films Made by Sputtering

被引:4
作者
Isidorsson, J. [1 ]
Stromme, M. [1 ]
Gahlin, R. [1 ]
Niklasson, G. A. [1 ]
Granqvist, C. G. [1 ]
Haggstrom, L. [2 ]
机构
[1] Uppsala Univ, Dept Technol, S-75121 Uppsala, Sweden
[2] Uppsala Univ, Dept Phys, S-75121 Uppsala, Sweden
关键词
D O I
10.1007/BF02375283
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Sn oxide films were made by reactive rf magnetron sputtering under conditions that led to both electronic and ionic conductivity. The film structure was studied by X-ray diffraction and Atomic Force Microscopy (AFM). Li(+) intercalation produced electrochromism with coloration efficiency peaked in the infrared. Cyclic voltammograms taken at different sweep rates were interpreted in terms of a unique structural parameter related to the fractal dimension of a self-affine surface relief and in excellent agreement with the fractal dimension as obtained with AFM. Mossbauer spectroscopy was used to determine the valence state of the Sn-atoms; a change from Sn(4+) to Sn(2+) was detected after electrochemical intercalation of Li(+).
引用
收藏
页码:400 / 405
页数:6
相关论文
共 18 条
[11]   ELECTROCHEMICAL AND STRUCTURAL-PROPERTIES OF SNO2 AND SBSNO2 TRANSPARENT ELECTRODES WITH MIXED ELECTRONICALLY CONDUCTIVE AND ION-STORAGE CHARACTERISTICS [J].
OREL, B ;
LAVRENCICSTANGAR, U ;
KALCHER, K .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1994, 141 (09) :L127-L130
[12]   DIFFUSION TO FRACTAL SURFACES .3. LINEAR SWEEP AND CYCLIC VOLTAMMOGRAMS [J].
PAJKOSSY, T ;
NYIKOS, L .
ELECTROCHIMICA ACTA, 1989, 34 (02) :181-186
[13]   ELECTRONIC-STRUCTURE OF SNO2, GEO2, PBO2, TEO2 AND MGF2 [J].
ROBERTSON, J .
JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1979, 12 (22) :4767-4776
[14]   CHARACTERIZATION OF TIN OXIDE THIN-FILMS DEPOSITED BY REACTIVE SPUTTERING [J].
STEDILE, FC ;
DEBARROS, BAS ;
LEITE, CVB ;
FREIRE, FL ;
BAUMVOL, IJR ;
SCHREINER, WH .
THIN SOLID FILMS, 1989, 170 (02) :285-291
[15]   OPTICAL AND ELECTRICAL-PROPERTIES OF RADIO-FREQUENCY SPUTTERED TIN OXIDE-FILMS DOPED WITH OXYGEN VACANCIES, F, SB, OR MO [J].
STJERNA, B ;
OLSSON, E ;
GRANQVIST, CG .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (06) :3797-3817
[16]   CHARACTERIZATION OF RF-SPUTTERED SNOX THIN-FILMS BY ELECTRON-MICROSCOPY, HALL-EFFECT MEASUREMENT, AND MOSSBAUER SPECTROMETRY [J].
STJERNA, B ;
GRANQVIST, CG ;
SEIDEL, A ;
HAGGSTROM, L .
JOURNAL OF APPLIED PHYSICS, 1990, 68 (12) :6241-6245
[17]   ELECTRICAL-CONDUCTIVITY AND OPTICAL TRANSMITTANCE OF SPUTTER-DEPOSITED SNOX THIN-FILMS [J].
STJERNA, B ;
GRANQVIST, CG .
SOLAR ENERGY MATERIALS, 1990, 20 (03) :225-233
[18]   VOLTAMMETRY ON FRACTALS [J].
STROMME, M ;
NIKLASSON, GA ;
GRANQVIST, CG .
SOLID STATE COMMUNICATIONS, 1995, 96 (03) :151-154