RECENT DEVELOPMENTS IN QUANTITATIVE XPS IN THE USSR

A review of the recent theoretical and practical achievements in quantitative XPS in the USSR is presented. The following items are discussed: theoretical development-determination of in-depth profiles on the basis of angular dependences of ESCA intensities, correction for contamination layer, quantitative characterization of the supported particles, determination or calculation of some physical parameters (photoionization) cross-sections, photoelectron mean free paths, line shapes); practical application of quantitative ESCA surface analysis-high-temperature superconductors, oxidation of alloys and metals, fluorination of alloys and metals, amorphous alloys, catalysts, semiconductors and related systems, oxides and related systems, adsorption, films on solids.