MIGRATION OF METALS ON GRAPHITE IN SCANNING-TUNNELING-MICROSCOPY

被引:11
|
作者
OHTO, M
YAMAGUCHI, S
TANAKA, K
机构
[1] Department of Applied Physics, Hokkaido University, Sapporo
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1995年 / 34卷 / 6A期
关键词
SCANNING; TUNNELING; MICROSCOPE; SURFACE MODIFICATION; ELECTROMIGRATION; THERMOMIGRATION; GRAPHITE; METAL MIGRATION;
D O I
10.1143/JJAP.34.L694
中图分类号
O59 [应用物理学];
学科分类号
摘要
Metals such as Au deposited on graphite substrates are found to migrate very easily when biased in scanning tunneling microscopes. Depending upon the him thickness and the tip voltage, a hillock surrounded by grooves or a hole surrounded by hillocks with a height of similar to +/-10 nm and a lateral dimension of similar to 100 nm are formed. The mechanism of these surface-modification phenomena is discussed in light of electro- and thermomigration.
引用
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页码:L694 / L697
页数:4
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