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CRYPTOGRAPHIC SYSTEMS USING REDUNDANCY
被引:5
作者
:
AGNEW, GB
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical Engineering, University of Waterloo, Waterloo
AGNEW, GB
机构
:
[1]
Department of Electrical Engineering, University of Waterloo, Waterloo
来源
:
IEEE TRANSACTIONS ON INFORMATION THEORY
|
1990年
/ 36卷
/ 01期
基金
:
加拿大自然科学与工程研究理事会;
关键词
:
D O I
:
10.1109/18.50371
中图分类号
:
TP [自动化技术、计算机技术];
学科分类号
:
0812 ;
摘要
:
The problem of ensuring recoverability' of encrypting data in a file storage system is examined. In this situation, the original data (plaintext) will be removed from the system after encryption. In the event of errors either in the initial processing or in the storage of the data, the file may be rendered unrecoverable. A model of a file storage system is developed that incorporates errors in these areas. A two stage coding system involving error correcting codes and interleaving is then introduced. The performance of this system is then analyzed for various sizes of encryption blocks and error correcting codes. © 1990 IEEE
引用
收藏
页码:31 / 39
页数:9
相关论文
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[1]
STABILITY AND SER ANALYSIS OF STATIC RAM CELLS
CHAPPELL, B
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SAIHALASZ, GA
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
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470
[2]
DENNING D, 1983, CRYPTOGRAPHY DATA SE, pCH1
[3]
GALLAGHER RG, 1968, INFORMATION THEORY R, pCH1
[4]
WORST-CASE STATIC NOISE MARGIN CRITERIA FOR LOGIC-CIRCUITS AND THEIR MATHEMATICAL EQUIVALENCE
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机构:
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CSIR,NATL ELECT ENGN RES INST,PRETORIA,SOUTH AFRICA
CSIR,NATL ELECT ENGN RES INST,PRETORIA,SOUTH AFRICA
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[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
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[5]
MARK JW, 1983, CCNG E111 U WAT REP
[6]
ALPHA-PARTICLE-INDUCED SOFT ERROR RATE IN VLSI CIRCUITS
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DENNARD, RH
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DENNARD, RH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
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731
[7]
TANENBAUM AS, 1981, COMPUTER NETWORKS, pCH4
[8]
1977, NBS FIPS PUB46
←
1
→
共 8 条
[1]
STABILITY AND SER ANALYSIS OF STATIC RAM CELLS
CHAPPELL, B
论文数:
0
引用数:
0
h-index:
0
CHAPPELL, B
SCHUSTER, SE
论文数:
0
引用数:
0
h-index:
0
SCHUSTER, SE
SAIHALASZ, GA
论文数:
0
引用数:
0
h-index:
0
SAIHALASZ, GA
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1985,
32
(02)
: 463
-
470
[2]
DENNING D, 1983, CRYPTOGRAPHY DATA SE, pCH1
[3]
GALLAGHER RG, 1968, INFORMATION THEORY R, pCH1
[4]
WORST-CASE STATIC NOISE MARGIN CRITERIA FOR LOGIC-CIRCUITS AND THEIR MATHEMATICAL EQUIVALENCE
LOHSTROH, J
论文数:
0
引用数:
0
h-index:
0
机构:
CSIR,NATL ELECT ENGN RES INST,PRETORIA,SOUTH AFRICA
CSIR,NATL ELECT ENGN RES INST,PRETORIA,SOUTH AFRICA
LOHSTROH, J
SEEVINCK, E
论文数:
0
引用数:
0
h-index:
0
机构:
CSIR,NATL ELECT ENGN RES INST,PRETORIA,SOUTH AFRICA
CSIR,NATL ELECT ENGN RES INST,PRETORIA,SOUTH AFRICA
SEEVINCK, E
DEGROOT, J
论文数:
0
引用数:
0
h-index:
0
机构:
CSIR,NATL ELECT ENGN RES INST,PRETORIA,SOUTH AFRICA
CSIR,NATL ELECT ENGN RES INST,PRETORIA,SOUTH AFRICA
DEGROOT, J
[J].
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1983,
18
(06)
: 803
-
807
[5]
MARK JW, 1983, CCNG E111 U WAT REP
[6]
ALPHA-PARTICLE-INDUCED SOFT ERROR RATE IN VLSI CIRCUITS
SAIHALASZ, GA
论文数:
0
引用数:
0
h-index:
0
SAIHALASZ, GA
WORDEMAN, MR
论文数:
0
引用数:
0
h-index:
0
WORDEMAN, MR
DENNARD, RH
论文数:
0
引用数:
0
h-index:
0
DENNARD, RH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
: 725
-
731
[7]
TANENBAUM AS, 1981, COMPUTER NETWORKS, pCH4
[8]
1977, NBS FIPS PUB46
←
1
→