DISCUSSION OF ERRORS ARISING FROM SURFACE ROUGHNESS IN ELLIPSOMETRIC MEASUREMENT OF REFRACTIVE INDEX OF A SURFACE

被引:0
作者
PRIMAK, W
MCCRACKI.FL
BENNETT, HE
SMITH, P
机构
关键词
D O I
暂无
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:96 / &
相关论文
共 50 条
  • [41] Proportional effect in refractive index of optical mediums for single layer homogeneous modeling of surface roughness
    Singh, A. P.
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2018, 20 (9-10): : 459 - 461
  • [42] Refractive Index of Single Surface Nanobubbles
    Zhou, Kai
    Chang, Aosheng
    Wang, Xue
    Jiang, Yingyan
    Wang, Yongjie
    Lu, Xinchao
    Wang, Wei
    CHEMICAL & BIOMEDICAL IMAGING, 2023, 1 (04): : 387 - 394
  • [43] Surface refractive index field estimation from multiple radars
    Hao, YG
    Goeckel, D
    Janaswamy, R
    Frasier, S
    RADIO SCIENCE, 2006, 41 (03)
  • [44] Surface Wave Cloak from Graded Refractive Index Nanocomposites
    La Spada, L.
    McManus, T. M.
    Dyke, A.
    Haq, S.
    Zhang, L.
    Cheng, Q.
    Hao, Y.
    SCIENTIFIC REPORTS, 2016, 6
  • [45] Surface Wave Cloak from Graded Refractive Index Nanocomposites
    L. La Spada
    T. M. McManus
    A. Dyke
    S. Haq
    L. Zhang
    Q. Cheng
    Y. Hao
    Scientific Reports, 6
  • [46] Study on measurement of thickness and refractive index of rough surface films by using ellipsometry
    Liu, Chongjin
    Shen, Jiarui
    Li, Fengxian
    Guangxue Jishu/Optical Technique, 1995, (03): : 18 - 20
  • [47] Refractive index measurement of the smallest bulk and surface glass microfragments in a model case
    Voros, Tamas
    Takacs, Krisztina
    JOURNAL OF FORENSIC SCIENCES, 2021, 66 (05) : 1948 - 1955
  • [48] Simultaneous Measurement of Refractive Index and Temperature Based on Surface Plasmon Resonance Sensors
    Xiao, Feng
    Michel, David
    Li, Guangyuan
    Xu, Anshi
    Alameh, Kamal
    JOURNAL OF LIGHTWAVE TECHNOLOGY, 2014, 32 (21) : 4169 - 4173
  • [49] Measurement of refractive index change by surface plasmon resonance and phase quadrature interferometry
    Lee, Ju-Yi
    Shih, Hsueh-Ching
    Hong, Cyun-Tai
    Chou, Teng Ko
    OPTICS COMMUNICATIONS, 2007, 276 (02) : 283 - 287
  • [50] MD simulation of sputtering on surface index and surface roughness dependence
    Muramoto, T.
    Kenmotsu, T.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 255 (01) : 214 - 218