共 50 条
- [21] BIREFRINGENCE MEASUREMENTS OF THIN DIELECTRIC FILMS BY THE PRISM COUPLER METHOD APPLIED OPTICS, 1984, 23 (16): : 2760 - 2762
- [25] Analysis of anisotropic thin film parameters from prism coupler measurements Wang, Haiming, 1600, Taylor & Francis Ltd, Basingstoke, United Kingdom (42):
- [26] CRITICAL THICKNESS OF BERYLLIUM FILMS CONDENSED ON COLD SUBSTRATE FIZIKA METALLOV I METALLOVEDENIE, 1972, 33 (05): : 984 - &
- [27] NONLINEAR TOTALLY REFLECTING PRISM COUPLER - THERMOMECHANIC EFFECTS AND INTENSITY-DEPENDENT REFRACTIVE-INDEX OF THIN-FILMS APPLIED OPTICS, 1995, 34 (21): : 4358 - 4369
- [28] CRITICAL DEPTH OF BERYLLIUM FILM CONDENSED ONTO A COLD SUBSTRATE PHYSICS OF METALS AND METALLOGRAPHY, 1972, 33 (05): : 78 - 83
- [29] PLASTIC PROPERTIES OF POLYCRYSTALLINE THIN-FILMS ON A SUBSTRATE PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1979, 39 (04): : 507 - 516
- [30] EFFECT OF SUBSTRATE ON RADIATIVE PROPERTIES OF THIN-FILMS APPLIED OPTICS, 1973, 12 (08): : 1904 - 1908