ORIGINAL HIGHLY ACCURATE GONIOMETER FOR X-RAY-POWDER DIFFRACTION AT CONTROLLED TEMPERATURE

被引：78

作者：

BERAR, JF

CALVARIN, G

WEIGEL, D

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1980年 / 13卷 / JUN期

关键词：

D O I：

10.1107/S0021889880011934

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：201 / 206

页数：6

共 9 条

[1]

BERAR JF, 1974, THESIS U PARIS 6

[2] X-RAY DETERMINATION OF LATTICE-PARAMETER AND THERMAL-EXPANSION OF LEAD NITRATE [J].

BICHILE, GK ;

KULKARNI, RG .

ACTA CRYSTALLOGRAPHICA SECTION A, 1975, 31 (JUL1) :446-448

[3] DESIGN AND FABRICATION OF A 10 CM DIAMETER BACK-REFLECTION FOCUSING CAMERA [J].

BICHILE, GK ;

KULKARNI, RG .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1977, 10 (DEC) :441-443

[4] STUDY OF X-RAY-DIFFRACTION ON POWDER OF ORDER-DISORDER TRANSITION OF FERROCENE FE(C5H5)2 [J].

CALVARIN, G ;

BERAR, JF .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1975, 8 (JUN1) :380-385

[5] LEAD OXIDES .3. X-RAY-DIFFRACTION STUDY OF FERROELECTRIC AND FERROELASTIC TRANSITION POWDER - PB3O4 [J].

GARNIER, P ;

CALVARIN, G ;

WEIGEL, D .

JOURNAL OF SOLID STATE CHEMISTRY, 1976, 16 (1-2) :55-62

[6] NEW MODEL OF BOND DIFFRACTOMETER FOR PRECISE DETERMINATION OF LATTICE-PARAMETERS AND THERMAL-EXPANSION OF SINGLE-CRYSTALS [J].

LUKASZEWICZ, K ;

KUCHARCZYK, D ;

MALINOWSKI, M ;

PIETRASZKO, A .

KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1978, 13 (05) :561-567

[7]

TOURNARIE M, 1954, J PHYS RADIUM, V15, pA11

[8]

WILSON A, 1964, THEORIE MATH DIFFRAC

[9]

1968, INT TABLES XRAY CRIS, V3, P122

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