AN ADVANCED INTEGRATED OPTICAL RF SPECTRUM ANALYZER

被引：0
|
作者：
MERGERIAN, D [1 ]
MALARKEY, EC [1 ]
PAUTIENUS, RP [1 ]
BRADLEY, JC [1 ]
KELLNER, AL [1 ]
MILL, MD [1 ]
机构：
[1] WESTINGHOUSE ELECT CORP,DIV SYST DEV,BALTIMORE,MD 21203
来源：
IEEE TRANSACTIONS ON SONICS AND ULTRASONICS | 1982年 / 29卷 / 03期
关键词：
D O I：
暂无
中图分类号：
O42 [声学];
学科分类号：
070206 ; 082403 ;
摘要：
引用
收藏
页码：175 / 175
页数：1
相关论文
共 50 条
  • [1] INTEGRATED OPTICAL RF SPECTRUM ANALYZER
    HAMILTON, MC
    WILLE, DA
    MICELI, WJ
    OPTICAL ENGINEERING, 1977, 16 (05) : 475 - 478
  • [2] INTEGRATED OPTICAL RF SPECTRUM ANALYZER
    MERGERIAN, D
    MALARKEY, EC
    MICROWAVE JOURNAL, 1980, 23 (09) : 37 - &
  • [3] INTEGRATED OPTICAL RF SPECTRUM ANALYZER
    HAMILTON, MC
    WILLE, DA
    MICELI, WJ
    IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1977, 24 (02): : 144 - 144
  • [4] ADVANCED INTEGRATED OPTIC RF SPECTRUM ANALYZER
    MERGERIAN, D
    MALARKEY, EC
    PAUTIENUS, RP
    BRADLEY, JC
    MILL, M
    BAUGH, CW
    KELLNER, AL
    MENTZER, M
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1982, 321 : 149 - 156
  • [5] OPERATIONAL INTEGRATED OPTICAL RF SPECTRUM ANALYZER
    MERGERIAN, D
    MALARKEY, EC
    PAUTIENUS, RP
    BRADLEY, JC
    MARX, GE
    HUTCHESON, LD
    KELLNER, AL
    APPLIED OPTICS, 1980, 19 (18): : 3033 - 3034
  • [6] INTEGRATED OPTICAL-SPECTRUM ANALYZER
    MERGERIAN, D
    MALARKEY, EC
    MARX, GE
    BRADLEY, JC
    PAUTIENUS, RP
    IEEE JOURNAL OF QUANTUM ELECTRONICS, 1979, 15 (09) : D78 - D79
  • [7] A NEW CONFIGURATION OF INTEGRATED ACOUSTIC RF SPECTRUM ANALYZER
    王佐卿
    Chinese Journal of Acoustics, 1988, (01) : 56 - 63
  • [8] New configuration of integrated acoustic RF spectrum analyzer
    Wang, Zuoqing
    Chinese Journal of Acoustics, 1988, 7 (01): : 56 - 63
  • [9] INTEGRATED-OPTICAL RF SPECTRUM ANALYZER IS OPERATED 1ST TIME AT WESTINGHOUSE
    不详
    LASER FOCUS WITH FIBEROPTIC TECHNOLOGY, 1980, 16 (08): : 36 - &
  • [10] MMICS FOR AN INTEGRATED RF SPECTRUM ANALYZER FRONT-END
    TAKENAKA, T
    MIYAZAKI, A
    MATSUURA, H
    IWAOKA, H
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1995, 44 (03) : 716 - 719
12345