TRIGGERING MECHANISMS IN TRIGGERED VACUUM GAPS

被引：51
作者：
BOXMAN, RL [1 ]
机构：
[1] TEL AVIV UNIV, SCH ENGN, RAMAT AVIV, ISRAEL
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 1977年 / 24卷 / 02期
关键词：
D O I：
10.1109/T-ED.1977.18690
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：122 / 128
页数：7
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