INTERFERENCE ELECTRON-MICROSCOPY BY MEANS OF HOLOGRAPHY

Electron holography was applied to interference microscopy by means of the phase-difference amplification technique. Image electron holograms were formed with a field emission electron microscope. Phase-amplified interferograms and contour maps were obtained by the illumination of two laser beams onto the holograms, at the optical reconstruction stage. The method was effectively applied to electron microscopic specimens such as polyhedral fine particles whose phase changes sometimes had not been large enough for interference microscopy. © 1979 The Japan Society of Applied Physics.