INTERFERENCE ELECTRON-MICROSCOPY BY MEANS OF HOLOGRAPHY

被引：47
|
作者：
ENDO, J
MATSUDA, T
TONOMURA, A
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1979年 / 18卷 / 12期
关键词：
D O I：
10.1143/JJAP.18.2291
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：2291 / 2294
页数：4
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