A SYSTEMATIC ANALYSIS OF HREM IMAGING OF SPHALERITE SEMICONDUCTORS

被引：30

作者：

GLAISHER, RW

SPARGO, AEC

SMITH, DJ

机构：

[1] UNIV MELBOURNE,SCH PHYS,PARKVILLE,VIC 3052,AUSTRALIA

[2] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

来源：

ULTRAMICROSCOPY | 1989年 / 27卷 / 02期

关键词：

D O I：

10.1016/0304-3991(89)90082-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：131 / 150

页数：20

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