TRANSMISSION ELECTRON-MICROSCOPY FOR THE DETERMINATION OF THE MICROSTRUCTURE OF THIN-FILMS AND INTERFACES

被引：5
|
作者：
MADDEN, MC
机构：
来源：
THIN SOLID FILMS | 1987年 / 154卷 / 1-2期
关键词：
D O I：
10.1016/0040-6090(87)90350-6
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：43 / 56
页数：14
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