TRANSMISSION ELECTRON-MICROSCOPY FOR THE DETERMINATION OF THE MICROSTRUCTURE OF THIN-FILMS AND INTERFACES

被引：5

|

作者：

MADDEN, MC

机构：

来源：

THIN SOLID FILMS | 1987年 / 154卷 / 1-2期

关键词：

D O I：

10.1016/0040-6090(87)90350-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

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页码：43 / 56

页数：14

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