THEORETICAL-STUDY OF THE ELECTRONIC-STRUCTURE OF SIOX

[1] TRENDS IN THE BAND-STRUCTURE OF DEFECT TETRAHEDRAL COMPOUND SEMICONDUCTORS - OXIDES AND OTHER SYSTEMS WITH 4-2 LOCAL COORDINATION [J]. JOURNAL DE PHYSIQUE, 1979, 40 (08): : 749 - 761

[2] FIELD-DEPENDENT INTERNAL PHOTOEMISSION PROBE OF ELECTRONIC-STRUCTURE OF SI-SIO2 INTERFACE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04): : 856 - 859

[3] THEORY OF BINARY-ALLOYS INCLUDING SHORT-RANGE ORDER PROPERTIES [J]. PHYSICAL REVIEW B, 1975, 12 (12): : 5664 - 5675

[4] ELECTRON-DIFFRACTION STUDY OF AMORPHOUS SILICON-OXIDE FILMS [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 34 (03) : 323 - 334

[5] HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY AS A PROBE OF LOCAL ATOMIC-STRUCTURE - APPLICATION TO AMORPHOUS SIO2 AND THE SI-SIO2 INTERFACE [J]. PHYSICAL REVIEW LETTERS, 1979, 43 (22) : 1683 - 1686

[6] EFFECT OF HEAT-TREATMENT ON CHEMICAL AND ELECTRONIC-STRUCTURE OF SOLID SIO - ELECTRON-SPECTROSCOPY STUDY [J]. SOLID STATE COMMUNICATIONS, 1977, 22 (05) : 277 - 280

[7] HOLLINGER G, 1979, THESIS U C BERNARD L

[8] ELECTRON-SPIN RESONANCE AND HOPPING CONDUCTIVITY OF A-SIOX [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 32 (1-3) : 327 - 338

[9] HUBNER K, 1980, J NONCRYST SOLIDS, V36, P1011

[10] CLUSTER-BETHE-LATTICE METHOD - ELECTRONIC DENSITY OF STATES OF AMORPHOUS AND CRYSTALLINE HOMOPOLAR SOLIDS [J]. PHYSICAL REVIEW B, 1974, 10 (12): : 5164 - 5174

[1] TRENDS IN THE BAND-STRUCTURE OF DEFECT TETRAHEDRAL COMPOUND SEMICONDUCTORS - OXIDES AND OTHER SYSTEMS WITH 4-2 LOCAL COORDINATION [J]. JOURNAL DE PHYSIQUE, 1979, 40 (08): : 749 - 761

[2] FIELD-DEPENDENT INTERNAL PHOTOEMISSION PROBE OF ELECTRONIC-STRUCTURE OF SI-SIO2 INTERFACE [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (04): : 856 - 859

[3] THEORY OF BINARY-ALLOYS INCLUDING SHORT-RANGE ORDER PROPERTIES [J]. PHYSICAL REVIEW B, 1975, 12 (12): : 5664 - 5675

[4] ELECTRON-DIFFRACTION STUDY OF AMORPHOUS SILICON-OXIDE FILMS [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 34 (03) : 323 - 334

[5] HIGH-RESOLUTION X-RAY PHOTOELECTRON-SPECTROSCOPY AS A PROBE OF LOCAL ATOMIC-STRUCTURE - APPLICATION TO AMORPHOUS SIO2 AND THE SI-SIO2 INTERFACE [J]. PHYSICAL REVIEW LETTERS, 1979, 43 (22) : 1683 - 1686

[6] EFFECT OF HEAT-TREATMENT ON CHEMICAL AND ELECTRONIC-STRUCTURE OF SOLID SIO - ELECTRON-SPECTROSCOPY STUDY [J]. SOLID STATE COMMUNICATIONS, 1977, 22 (05) : 277 - 280

[7] HOLLINGER G, 1979, THESIS U C BERNARD L

[8] ELECTRON-SPIN RESONANCE AND HOPPING CONDUCTIVITY OF A-SIOX [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 32 (1-3) : 327 - 338

[9] HUBNER K, 1980, J NONCRYST SOLIDS, V36, P1011

[10] CLUSTER-BETHE-LATTICE METHOD - ELECTRONIC DENSITY OF STATES OF AMORPHOUS AND CRYSTALLINE HOMOPOLAR SOLIDS [J]. PHYSICAL REVIEW B, 1974, 10 (12): : 5164 - 5174