HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF PRESSURE-AMORPHIZED ALPHA-QUARTZ

被引：30

作者：

WINTERS, RR ^{[1
]}

GARG, A ^{[1
]}

HAMMACK, WS ^{[1
]}

机构：

[1] CARNEGIE MELLON UNIV,DEPT CHEM ENGN,PITTSBURGH,PA 15213

来源：

PHYSICAL REVIEW LETTERS | 1992年 / 69卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.69.3751

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Alpha-quartz becomes x-ray amorphous when compressed, at ambient temperature, by pressures of 25 to 30 GPa [Hemley et al., Nature 334, 5 (1988)]. The relationship between pressure-amorphized and melt-quenched silica is of great interest. The most fundamental characteristic of melt-quenched silica is its lack of periodicity at the atomic level. We report here that high-resolution electron microscopy shows that alpha-quartz, pressure amorphized at 30.5 GPa is, as is conventional melt-quenched silica, amorphous at the atomic level.

引用

页码：3751 / 3753

页数：3

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