HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF PRESSURE-AMORPHIZED ALPHA-QUARTZ

被引:30
作者
WINTERS, RR [1 ]
GARG, A [1 ]
HAMMACK, WS [1 ]
机构
[1] CARNEGIE MELLON UNIV,DEPT CHEM ENGN,PITTSBURGH,PA 15213
关键词
D O I
10.1103/PhysRevLett.69.3751
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Alpha-quartz becomes x-ray amorphous when compressed, at ambient temperature, by pressures of 25 to 30 GPa [Hemley et al., Nature 334, 5 (1988)]. The relationship between pressure-amorphized and melt-quenched silica is of great interest. The most fundamental characteristic of melt-quenched silica is its lack of periodicity at the atomic level. We report here that high-resolution electron microscopy shows that alpha-quartz, pressure amorphized at 30.5 GPa is, as is conventional melt-quenched silica, amorphous at the atomic level.
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页码:3751 / 3753
页数:3
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