IMPROVEMENT OF DURABILITY AND CORROSION-RESISTANCE OF METAL EVAPORATED TAPE WITH CHEMICALLY DEPOSITED SIOX OVERCOAT

被引：0

作者：

DAIMON, H

SUGIYAMA, Y

ICHIJO, M

MIZUMURA, T

机构：

[1] Engineering Research Laboratory, Hitachi Maxell Ltd., Tsukuba-gun, Ibaraki 300-24, 6-20-1 Kinunodai, Yawara-mura

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1995年 / 31卷 / 06期

关键词：

D O I：

10.1109/20.490198

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

To improve reliability of metal evaporated tape (ME tape), SiOx overcoat was Investigated, Durability of ME tape overcoated with SiOx was greatly improved by lubricating with C18H37OP(H)(O)OH (mono octadecyl phosphite: MOP), which showed more than 10 hours life time in still mode durability test (relative speed of head to media:11.3m/s). Since MOP was solid at room temperature, adhesion did not occur and friction force during the test reduced by 25% compared with perfluoropolyether liquid lubricant Corrosion of ME tape was prevented by SiOx overcoat prepared by plasma enhanced chemical vapor deposition (PECVD). Water transmission rate of PECVD-SiOx was one tenth of physically deposited SiOx, which well suppressed surface corrosion of ME tape in the atmosphere of 60 degrees C 90%R.H. and of 4 ppm SO 2(40 degrees C 80%R.H.).

引用

页码：2943 / 2945

页数：3