NONPARAMETRIC QUALITY-CONTROL CHARTS BASED ON THE SIGN STATISTIC

被引:133
|
作者
AMIN, RW
REYNOLDS, MR
BAKIR, S
机构
[1] UNIV W FLORIDA,DEPT MATH & STAT,PENSACOLA,FL 32514
[2] VIRGINIA POLYTECH INST & STATE UNIV,DEPT STAT,BLACKSBURG,VA 24061
[3] VIRGINIA POLYTECH INST & STATE UNIV,DEPT FORESTRY,BLACKSBURG,VA 24061
[4] ALABAMA STATE UNIV,DEPT BUSINESS ADM,MONTGOMERY,AL 36101
关键词
AVERAGE RUN LENGTH; CUMULATIVE SUM; PROCESS CONTROL; SIGN TEST; SIGN CHART; CURTAILED SAMPLING;
D O I
10.1080/03610929508831574
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
Nonparametric control chart are presented for the problem of detecting changes in the process median (or mean), or changes in the process variability when samples are taken at regular time intervals. The proposed procedures are based on sign-test statistics computed for each sample, and are used in Shewhart and cumulative sum control charts. When the process is in control the run length distributions for the proposed nonparametric control charts do not depend on the distribution of the observations. An additional advantage of the non-parametric control charts is that the variance of the process does not need to be established in order to set up a control chart for the mean. Comparisons with the corresponding parametric control charts are presented. It is also shown that curtailed sampling plans can considerably reduce the expected number of observations used in the Shewhart control schemes based on the sign statistic.
引用
收藏
页码:1597 / 1623
页数:27
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