SCANNING OPTICAL MICROSCOPY OF SEMICONDUCTOR-MATERIALS AND DEVICES

被引：0

|

作者：

SHEPPARD, CJR

机构：

来源：

SCANNING MICROSCOPY | 1989年 / 3卷 / 01期

关键词：

D O I：

暂无

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

收藏

页码：15 / 24

页数：10

相关论文

共 50 条

[21] MICROSCOPIC SIMULATION OF ELECTRONIC NOISE IN SEMICONDUCTOR-MATERIALS AND DEVICES
VARANI, L
REGGIANI, L
KUHN, T
GONZALEZ, T
PARDO, D
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1994, 41 (11) : 1916 - 1925
[22] NOISE METHODS OF MEASURING THE PARAMETERS OF SEMICONDUCTOR-MATERIALS AND DEVICES
LUKYANCHIKOVA, NB
MEASUREMENT TECHNIQUES, 1986, 29 (04) : 356 - 359
[23] REVIEW OF III-V SEMICONDUCTOR-MATERIALS AND DEVICES
SEALY, BJ
JOURNAL OF THE INSTITUTION OF ELECTRONIC AND RADIO ENGINEERS, 1987, 57 (01): : S3 - S12
[24] Electrical characterization of semiconductor materials and devices using scanning probe microscopy
De Wolf, P
Brazel, E
Erickson, A
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2001, 4 (1-3) : 71 - 76
[25] SCANNING ELECTRON-MICROSCOPIC TECHNIQUES FOR CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS
YOUNG, RA
KALIN, RV
ACS SYMPOSIUM SERIES, 1986, 295 : 49 - 74
[26] THE MICROSCOPY OF BULK-GROWN-III-V SEMICONDUCTOR-MATERIALS
BROWN, GT
ANNUAL REVIEW OF MATERIALS SCIENCE, 1987, 17 : 123 - 148
[27] CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS AND STRUCTURES BY TRANSMISSION ELECTRON-MICROSCOPY
GRAHAM, RJ
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1988, 135 (08) : C373 - C373
[28] APPLICATIONS OF TRANSMISSION ELECTRON-MICROSCOPY IN CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS
NARAYANAN, GH
JOURNAL OF ELECTRON MICROSCOPY, 1977, 26 (02): : 182 - 182
[29] SPECTROSCOPIC METHODS FOR NOISE-LEVELS IN SEMICONDUCTOR-MATERIALS AND DEVICES
LUKYANCHIKOVA, NB
MEASUREMENT TECHNIQUES USSR, 1990, 33 (04): : 394 - 399
[30] CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS AND DEVICES BY SURFACE-ANALYSIS TECHNIQUES
VANOOSTROM, A
VACUUM, 1984, 34 (10-1) : 881 - 892

← 1 2 3 4 5 →