共 50 条
- [1] SCANNING FORCE MICROSCOPY OF SEMICONDUCTOR-MATERIALS AND DEVICES MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1994, 24 (1-3): : 203 - 208
- [2] A SCANNING OPTICAL MICROSCOPE FOR THE INSPECTION OF SEMICONDUCTOR-MATERIALS AND DEVICES JOURNAL OF MICROSCOPY-OXFORD, 1980, 118 (MAR): : 309 - 314
- [3] TRANSMISSION ELECTRON-MICROSCOPY OF SEMICONDUCTOR-MATERIALS AND DEVICES SCANNING ELECTRON MICROSCOPY, 1985, : 1001 - 1009
- [4] NONDESTRUCTIVE OPTICAL TECHNIQUES FOR CHARACTERIZING SEMICONDUCTOR-MATERIALS AND DEVICES AT&T TECHNICAL JOURNAL, 1994, 73 (02): : 66 - 76
- [6] Scanning capacitance microscopy on semiconductor materials and devices PROCEEDINGS OF THE 5TH MULTINATIONAL CONGRESS ON ELECTRON MICROSCOPY, 2001, : 311 - 312
- [7] Scanning force microscopy of semiconductor materials and devices Materials science & engineering. B, Solid-state materials for advanced technology, 1994, B24 (1-3): : 203 - 208
- [10] ELECTRICAL CHARACTERIZATION OF SEMICONDUCTOR-MATERIALS AND DEVICES ACS SYMPOSIUM SERIES, 1986, 295 : 18 - 33