X-RAY-DIFFRACTION PROFILE ANALYSIS FOR THE DETERMINATION OF THE CRYSTAL-STRUCTURE OF BATIO3

被引：7

|

作者：

TANAKA, M

FUJISHITA, H

SHIOZAKI, Y

SAWAGUCHI, E

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1980年 / 19卷 / 09期

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D O I：

10.1143/JJAP.19.1757

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1757 / 1762

页数：6

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