X-RAY-DIFFRACTION PROFILE ANALYSIS FOR THE DETERMINATION OF THE CRYSTAL-STRUCTURE OF BATIO3

被引：7
作者：
TANAKA, M
FUJISHITA, H
SHIOZAKI, Y
SAWAGUCHI, E
机构：
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS | 1980年 / 19卷 / 09期
关键词：
D O I：
10.1143/JJAP.19.1757
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：1757 / 1762
页数：6
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