MODEL STUDIES OF KINKED Z TRACE IN TOPSIDE IONOGRAMS

被引:4
作者
COLIN, L
CHAN, KL
机构
[1] NASA Ames Research Center, Moffett Field, Calif.
关键词
D O I
10.1109/PROC.1969.7169
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The propagation characteristics of the Z trace observed on topside ionograms are reviewed. One feature, the “kinked” Ztrace, is examined in detail. It is shown that the kink can be explained by simple magnetoionic theory and is not due to peculiar electron density distributions. A ray tracing propagation analysis confirms this contention. Although the Z trace normally does not propagate down to the Flayer peak, its inherent resolution is superior to that of the ordinary and extraordinary modes. Its use in ionogram analysis may thus improve the accuracy of electron density profile calculations. Copyright © 1969 by The Inshtute of Electrical and Electronics Engineers Inc.
引用
收藏
页码:1143 / &
相关论文
共 5 条
[1]  
COLIN L, 1969, D5052 NASA TN
[2]  
DAVIES K, 1965, NBS80 MON
[3]   REDUCTION OF TOPSIDE IONOGRAMS TO ELECTRON-DENSITY PROFILES [J].
JACKSON, JE .
PROCEEDINGS OF THE IEEE, 1969, 57 (06) :960-&
[4]  
JACKSON JE, 1967, X61567452 NASA GODD