RHENIUM TIPS FOR STABLE SCANNING-TUNNELING-MICROSCOPY

被引：11
作者：
WATANABE, MO
KINNO, T
机构：
[1] Toshiba R and D Center, Saiwai-ku, 210
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1993年 / 32卷 / 9A期
关键词：
SCANNING TUNNELING MICROSCOPY; FIELD ION MICROSCOPY; TIP; RHENIUM; HEXAGONAL CLOSED-PACKED METAL; SURFACE;
D O I：
10.1143/JJAP.32.L1266
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
A rhenium (Re) tip has been investigated for scanning tunneling microscopy (STM). Most of the Re tips etched electrochemically from poly-crystalline wires were found to have a [1120BAR]-oriented apex by field ion microscopy. A single atom of the tip apex surface has been expected to be stable, because of its high coordination number. The 7 x 7 reconstructions of silicon (111) surfaces were observed at atomic level by STM using the Re tip. These results suggest that a Re tip with a single apex atom can be one of the most stable tips for STM.
引用
收藏
页码：L1266 / L1268
页数：3
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