DIFFERENTIAL PULSE POLAROGRAPHIC-DETERMINATION OF TRACES OF ARSENIC IN SEMICONDUCTOR SILICON

被引：0

作者：

BULDINI, PL ^{[1
]}

FERRI, D ^{[1
]}

LANZA, P ^{[1
]}

机构：

[1] UNIV BOLOGNA,CHEM INST G CIAMICIAN,I-40126 BOLOGNA,ITALY

来源：

ANALYTICA CHIMICA ACTA | 1980年 / 113卷 / 01期

关键词：

D O I：

暂无

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：171 / 173

页数：3

共 13 条

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FERRI, D ;

LANZA, P .

ANALYTICA CHIMICA ACTA, 1979, 106 (01) :137-139

[2]

BULDINI PL, CHEM GEOL

[3]

DECORTE F, 1971, J RADIOANAL CHEM, V9, P9

[4] DETERMINATION OF TRACES OF ARSENIC IN SILICEOUS MATERIALS [J].

FELDMAN, C .

ANALYTICAL CHEMISTRY, 1977, 49 (06) :825-828

[5]

KEENAN JA, 1971, CHEM INSTRUM, V3, P125

[6] DETERMINATION OF COPPER IN SILICON BY ANODIC-STRIPPING AND DIFFERENTIAL PULSE VOLTAMMETRY [J].

LANZA, P ;

LIPPOLIS, MT .

ANALYTICA CHIMICA ACTA, 1976, 87 (01) :27-35

[7] DETERMINATION OF CARBON IN SILICON BY WET OXIDATION AND ELECTRICAL-CONDUCTIVITY MEASUREMENT [J].

LANZA, P ;

BULDINI, PL .

ANALYTICA CHIMICA ACTA, 1976, 85 (01) :69-74

[8] DETERMINATION OF IMPURITIES IN GERMANIUM AND SILICON [J].

LUKE, CL ;

CAMPBELL, ME .

ANALYTICAL CHEMISTRY, 1953, 25 (11) :1588-1593

[9]

LUNDE G, 1970, SOLID STATE TECHNOL, V13, P61

[10]

MARUNINA NI, 1976, ZH ANAL KHIM, V31, P1146

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