BLOCK-REPLICATE CHIP OPERATION AT 250 KHZ OVER THE TEMPERATURE-RANGE -25-DEGREES-C TO 75-DEGREES-C

被引：1
作者：
CHANG, CTM
HUBBELL, WC
DIMYAN, MY
机构：
[1] Central Research Laboratories, Texas Instruments Incorporated, Dallas
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1979年 / 15卷 / 01期
关键词：
D O I：
10.1109/TMAG.1979.1060145
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A block-replicate chip employing asymmetric half-disc propagating elements, pickax replicator, and swap gates was designed and fabricated. One bit per rotating field cycle data rate was accrued for this design through the use of a data merge and one detector. Packaged chips were operated and characterized at 250 kHz over-25. to +75°C temperature range. A composite bias margin of 7 Oe under worst case loading at any given temperature in the temperature range was achieved. © 1979 IEEE
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页码：879 / 885
页数：7
相关论文
共 5 条
[1]   68 KBIT CAPACITY 16 MUM-PERIOD MAGNETIC-BUBBLE MEMORY CHIP DESIGN WITH 2MUM-MINIMUM FEATURES [J].
BONYHARD, PI ;
SMITH, JL .
IEEE TRANSACTIONS ON MAGNETICS, 1976, 12 (06) :614-617
[2]  
FERRIO T, 1977, MAR C AUT TEST EL MA
[3]   ELECTRICAL CHARACTERIZATION OF A PACKAGED 100K BIT MAJOR-MINOR LOOP BUBBLE DEVICE [J].
NADEN, RA ;
KEENAN, WR ;
LEE, DM .
IEEE TRANSACTIONS ON MAGNETICS, 1976, 12 (06) :685-687
[4]  
Sumner G. G., 1976, AIP Conference Proceedings, P157, DOI 10.1063/1.2946048
[5]  
Ypma J. E., 1976, AIP Conference Proceedings, P51, DOI 10.1063/1.30424
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