ON DOUBLE-REFRACTING MICROINTERFEROMETERS WHICH SUFFER FROM A VARIABLE INTERFRINGE SPACING ACROSS THE IMAGE PLANE

被引：7
作者：
PLUTA, M
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1987年 / 146卷
关键词：
D O I：
10.1111/j.1365-2818.1987.tb01325.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：41 / 54
页数：14
相关论文
共 10 条
[1]  
BARTHOLOMEYCZYK W, 1960, Z INSTR KDE, V68, P208
[2]  
BENNATTER R, 1979, REV SCI INSTRUM, V50, P1583
[3]  
FRANCON M, 1971, POLARIZATION INTERFE
[4]   QUANTITATIVE SURFACE-TOPOGRAPHY DETERMINATION BY NOMARSKI REFLECTION MICROSCOPY .2. MICROSCOPE MODIFICATION, CALIBRATION, AND PLANAR SAMPLE EXPERIMENTS [J].
HARTMAN, JS ;
GORDON, RL ;
LESSOR, DL .
APPLIED OPTICS, 1980, 19 (17) :2998-3009
[5]   APPLICATION OF A SIMPLE DIFFERENTIAL INTERFEROMETER TO HIGH-CURRENT ARC DISCHARGES [J].
KOGELSCHATZ, U .
APPLIED OPTICS, 1974, 13 (08) :1749-1752
[6]  
Nomarski G, 1955, J PHYS-PARIS, V16, p9S
[7]   DOUBLE REFRACTING INTERFERENCE MICROSCOPE WITH CONTINUOUSLY VARIABLE AMOUNT AND DIRECTION OF WAVEFRONT SHEAR [J].
PLUTA, M .
OPTICA ACTA, 1971, 18 (09) :661-&
[8]  
PLUTA M, 1987, J MICROSC-OXFORD, V145, P191
[9]   A DOUBLE REFRACTING INTERFERENCE MICROSCOPE WITH VARIABLE IMAGE DUPLICATION AND HALF-SHADE EYEPIECE [J].
PLUTA, M .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08) :685-&
[10]  
PLUTA M, 1961, POMIARY AUTOMATYKA K, V7, P183
1