A METHOD FOR MEASUREMENT OF LOSSES IN THE NOISE-MATCHING MICROWAVE NETWORK WHILE MEASURING TRANSISTOR NOISE PARAMETERS

被引：5
作者：
MARTINES, G
SANNINO, M
机构：
[1] Univ di Palermo, Italy, Univ di Palermo, Italy
来源：
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1987年 / 35卷 / 01期
关键词：
MICROWAVE MEASUREMENTS - Computer Interfaces - TRANSISTORS - Noise;
D O I：
10.1109/TMTT.1987.1133599
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A method for measuring the loss of a tuner network used as the noise-source admittance transformer in a noise parameter test set is presented. Since the method is based on noise figure measurement, the tuner losses are determined on-line while performing measurements to determine transistor noise parameters. Experiments carried out on a coaxial slide-screw tuner by means of a computer-assisted measurement setup are reported.
引用
收藏
页码：71 / 75
页数：5
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