SOME APPLICATIONS OF HIGH-ENERGY, HIGH-RESOLUTION AUGER-ELECTRON SPECTROSCOPY USING BREMSSTRAHLUNG RADIATION

被引：108

作者：

KOVER, L

VARGA, D

CSERNY, I

TOTH, J

TOKESI, K

机构：

[1] Institute of Nuclear Research, Hungarian Academy of Sciences, Debrecen, H-4001

来源：

SURFACE AND INTERFACE ANALYSIS | 1992年 / 19卷 / 1-12期

关键词：

D O I：

10.1002/sia.740190106

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Continuous distribution x-rays obtained from a high-voltage (20-30 kV) source with an Mo anode were used for exciting Si KLL, S KLL, Ag LMM and Mn KLL Auger transitions in the 1.5-5.5 keV kinetic energy range. X-ray-induced AES measurements were performed by a new, high-energy electron spectrometer demonstrating the obtainable resolution and the considerable gain in intensity in comparison with previous results.

引用

页码：9 / 15

页数：7

共 17 条

[1]

BARNA PB, COMMUNICATN

[2] X-RAY WAVELENGTHS [J].

BEARDEN, JA .

REVIEWS OF MODERN PHYSICS, 1967, 39 (01) :78-&

[3] THE KLL AUGER SPECTRUM OF MANGANESE [J].

BRABEC, V ;

DRAGOUN, O ;

RYSAVY, M ;

FISER, M ;

KOVALIK, A ;

CSERNY, I ;

KADAR, I .

ZEITSCHRIFT FUR PHYSIK A-HADRONS AND NUCLEI, 1983, 311 (1-2) :37-39

[4] STUDY OF K-LL AUGER PROCESSES FOR LIGHT-ELEMENTS ABOVE Z=10 [J].

CARLSON, TA ;

DRESS, WB ;

NYBERG, GL .

PHYSICA SCRIPTA, 1977, 16 (5-6) :211-216

[5] BREMSSTRAHLUNG-INDUCED AUGER PEAKS [J].

CASTLE, JE ;

WEST, RH .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1980, 18 (04) :355-358

[6]

CAZAUX J, 1982, APPL SURF SCI, V10, P124, DOI 10.1016/0378-5963(82)90140-4

[7] CONTINUOUS X-RAY-INDUCED AUGER-ELECTRON SPECTROSCOPY [J].

CAZAUX, J ;

DUC, TM .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1983, 31 (01) :13-23

[8]

DURBIN SM, 1985, SCANNING ELECTRON MI, V3, P1099

[9] THE K AUGER SPECTRUM OF MANGANESE FROM FE-55 DECAY [J].

KOVALIK, A ;

BRABEC, V ;

NOVAK, J ;

DRAGOUN, O ;

GOROZHANKIN, VM ;

NOVGORODOV, AF ;

VYLOV, T .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1990, 50 (1-2) :89-101

[10] SURFACE-ANALYSIS OF AIR-POLLUTANTS BY XPS - PROBLEMS AND EXPERIENCES [J].

KOVER, L ;

TOTH, J ;

SCHAG, JB ;

BORBELYKISS, I .

SURFACE AND INTERFACE ANALYSIS, 1989, 14 (05) :217-223

← 1 2 →