POSSIBLE DETERMINATION OF THICKNESS IN THIN LAYERS FROM MASS DISTRIBUTION AND ROENTGENOGRAPHIC INTERFEROMETRY

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作者：
STRUNK, R
WERNICKE, R
机构：
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ARCHIV FUR TECHNISCHES MESSEN UND INDUSTRIELLE MESSTECHNIK | 1971年 / 421期
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TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
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页码：R13 / &
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