GROWTH OF EPITAXIAL MGO FILMS ON SB-PASSIVATED (001)GAAS - PROPERTIES OF THE MGO/GAAS INTERFACE

被引:24
|
作者
TARSA, EJ [1 ]
WU, XH [1 ]
IBBETSON, JP [1 ]
SPECK, JS [1 ]
ZINCK, JJ [1 ]
机构
[1] HUGHES RES LABS,MALIBU,CA 90265
关键词
D O I
10.1063/1.113796
中图分类号
O59 [应用物理学];
学科分类号
摘要
The growth of epitaxial MgO films on Sb-passivated (001)GaAs using pulsed laser deposition has been investigated. The temperature at which the Sb-passivation layer was desorbed was found to have a significant effect on the interfacial properties of MgO/GaAs heterostructures. Heating the substrates to 350-380°C in vacuum resulted in a (1×3) GaAs surface reconstruction suitable for the growth of epitaxial MgO films. However, residual Sb was found to persist on the GaAs surface at temperatures as high as 500°C. MgO growth after Sb desorption at 350-380°C resulted in a nonuniform interfacial layer which varied in thickness from ∼0.1 to 1.5 nm, whereas substrates heated to 500°C prior to MgO growth displayed abrupt interfaces. Capacitance-voltage measurements indicated a qualitative difference in the interfacial electronic properties for the two cases.© 1995 American Institute of Physics.
引用
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页码:3588 / 3590
页数:3
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