MEASURING ELECTRIC RESISTANCE OF THIN-FILM CONTACTS

被引：0
|
作者：
YUSHCHUK, SI [1 ]
POPENKO, AM [1 ]
机构：
[1] LVOV PHYS TECH & RADIOENGN MEASUREMENT INST,LVOV,UKSSR
来源：
ZAVODSKAYA LABORATORIYA | 1973年 / 39卷 / 04期
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：450 / 451
页数：2
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