SUPPRESSION OF AL-GA INTERDIFFUSION BY A WNX FILM ON AN ALXGA1-XAS/ALAS SUPERLATTICE STRUCTURE

被引:15
作者
ALLEN, EL
PASS, CJ
DEAL, MD
PLUMMER, JD
CHIA, VFK
机构
[1] STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
[2] CHARLES EVANS & ASSOCIATES,REDWOOD CITY,CA 94063
关键词
D O I
10.1063/1.105748
中图分类号
O59 [应用物理学];
学科分类号
摘要
Undoped AlAs/AlxGa1-xAs superlattice structures were grown by molecular beam epitaxy and annealed under Si3N4, SiO2, or WNx encapsulant films, both with and without the presence of a Sn-12O implant. Enhancement of the Al-Ga interdiffusion coefficient occurred under the Si3N4 and SiO2 films due to indiffusion of Si from the films. Enhancement was even greater during diffusion of the Sn implant. In both cases intermixing enhancement was due to the Fermi level effect. Underneath the WNx film, however, interdiffusion was suppressed even in the presence of the Sn dopant.
引用
收藏
页码:3252 / 3254
页数:3
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